A stunning new imaging breakthrough lets scientists see — and fix — the atomic flaws hiding inside tomorrow’s computer chips.

Cornell researchers have used advanced electron microscopy to identify "mouse bite" defects in 3D transistors for the first time ...

For almost two decades, scientists have been trying to move beyond silicon, the material ...

For nearly two decades, two-dimensional (2D) semiconductors have been studied as a complement or possible successor to silicon transistors, promising smaller, faster and more energy-efficient ...

The research 'Impact of Contact Gating on Scaling of Monolayer 2D Transistors Using a Symmetric Dual-Gate Structure' appeared online February 17 2026 in ACS Nano from the lab of Aaron Franklin, a ...

Duke engineers show how a common device architecture used to test 2D transistors overstates their performance prospects in real-world devices.

The technology industry is obsessed with the future. Many of our modern marvels are rooted in the legacy of Bell Labs, an ...

Cornell researchers have used high-resolution 3D imaging to detect, for the first time, the atomic-scale defects in computer chips that can sabotage their performance. The imaging method, which was ...

Lab architecture used to test 2D semiconductors artificially boosts performance metrics, making it harder to assess whether these materials can truly replace silicon.

For nearly two decades, two‑dimensional (2D) semiconductors have been studied as a complement or possible successor to silicon transistors, promising ...

A research team led by Prof. Seunguk Song from the Department of Energy Science at Sungkyunkwan University (SKKU), in ...