(Nanowerk Spotlight) The drawbacks of existing measures for calibrating scanning probe microscopes (SPMs) based on various diffraction gratings and periodic ...

It’s a problem that few of us will ever face, but if you ever have to calibrate your scanning electron microscope, you’ll need a resolution target with a high contrast under an electron beam. This ...

High-accuracy determination of the position of features in the field of view (positioning) is one of the most significant functions of a camera used on a satellite. Knowledge of the inner orientation ...