Pipeline defect analysis and assessment remains a critical area of research, given its direct impact on the safety and reliability of energy transportation infrastructures. Mechanical defects such as ...
Semiconductor manufacturing creates a wealth of data – from materials, products, factory subsystems and equipment. But how do we best utilize that information to optimize processes and reach the goal ...
Korean researchers have developed a new analysis method capable of detecting “hidden defects” in semiconductors with a ...
Modern advanced packaging processes and shrinking semiconductor device sizes mean that it is vital to consistently eliminate sub-20 nm defects and surface contaminants. To do this effectively, the ...
In addition to surface and subsurface defects, residual stress represents a concern. Over time, these stress points, ...
Optical 3D metrology enables fast, non-contact surface roughness measurement of defects and roughness for precise ...