In the world of nanotechnology, where structures are measured in billionths of a meter, precise imaging and measurement techniques are essential. Critical Dimension Scanning Electron Microscopy ...
Unlike optical microscopy, SEM does not rely on light waves but instead uses a beam of electrons to interact with materials, enabling magnifications up to 300,000× and resolutions approaching 1 nm. 1 ...
A group of scientists from Nagoya University in Japan used a novel combination of technologies to investigate the principles of light–matter interaction in nanomaterials at the lowest and fastest ...
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