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A new technical paper titled “Scanning electron microscopy-based automatic defect inspection for semiconductor manufacturing: a systematic review” was published by researchers at KU Leuven and imec.

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Academic writing often has a reputation for being hard to follow, but what if you could use machine learning to summarize arguments in scientific papers so that even a seven-year-old could understand ...

is an investigations editor and feature writer covering technology and the people who make, use, and are affected by it. Since joining The Verge in 2014, he has won a Loeb Award for feature writing, ...