Scientists from China have developed a new deep-learning method for detecting defects in PV cells. Analyzing electroluminescence (EL) images, the novel system utilizes the YOLOv8 convolutional neural ...
A new technical paper titled “A Universal AI-Powered Segmentation Model for PCBA and Semiconductor” was published by researchers at Nordson Corporation. “This paper introduces a novel universal deep ...
Overview: Master deep learning with these 10 essential books blending math, code, and real-world AI applications for lasting ...
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