AFM is commonly used to characterize nanoparticles, which include valuable data related to their qualitative and quantitative properties. For instance, it provides information about the physical ...

Atomic force microscopy (AFM) is an advanced microscopy technique that enables researchers to characterize the surface features of nanoparticles as small as 6 nm across. Image Credit: sanjaya viraj ...

Researchers have developed a deep learning algorithm for removing systematic effects from atomic force microscopy images, enabling more precise profiles of material surfaces. Atomic force microscopy, ...

The deep learning algorithm developed by researchers at the University of Illinois Urbana-Champaign is trained to remove the effects of the probe’s width from AFM microscope images. As reported in the ...

Polymers are crucial across multiple sectors, including food packaging, tire fabrication, adhesives, and medical‑grade plastics. Photothermal atomic force microscope‑based infrared spectroscopy ...

What is Atomic Force Microscopy? Atomic force microscopy has been an effective and essential method utilized extensively for nanotechnology, physics, and biological applications. It is a surface ...